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Algerian Journal of Signals and Systems

ISSN(p):2543-3792 | ISSN(e):2676-1548
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Algerian Journal of Signals and Systems

E-ISSN 2676-1548
P-ISSN 2543-3792
Publisher Name Laboratory of Signals and Systems
Email rec79dz2002@yahoo.com
Language English
Starting Year 2016
Discipline Engineering Research
Frequency Quaterly
Website https://ajss.dz/index.php/ajss/index
Country Algeria
Accessing Method Free
Articles Format PDF
License Type Normal
Description The Algerian Journal of Signals and Systems; AJSS is published quarterly by the Signals and systems Laboratory at the Institute of Electrical and Electronic Engineering, M’hamed Bougara University of Boumerdes. The journal publishes papers dealing with all aspects of electrical systems and signals. AJSS aims to encourage and promote research in electrical engineering and electronics. It is a platform to share experiences and present research results in the fields of theoretical, experimental, and applied Electrical Engineering. The journal publishes research papers, review papers and case studies. The journal scope covers ; but not limited to, the following topics : Control Systems Engineering : Control and Robotics, Measurements and Instrumentation, System Identification, Nonlinear and Robust Control, Intelligent Control, Fault Diagnosis. Power Engineering : Power Systems analysis, Power Systems operation and control, Power Electronics, Machines and Electric drives, High Voltage Engineering, Renewable Energy, Energy Efficiency, Power quality, Smart Grid. Telecommunications and Signal Processing: Image and speech Processing, Pattern Recognition, Biomedical Imaging, RF/Microwave Circuits and Systems, Antennas and Wave Propagation, Radar and Satellite Systems, Information Theory and Coding, Wireless and Mobile Communications. Computer Engineering and applications: Design and development methodologies, Embedded Architectures and Technologies, Intelligent Systems and Application, Microprocessor, Microcontroller, DSP, FPGA based Systems. Microelectronics: Material science, modeling, Semiconductor Characterization and Modeling, Metamaterial application.

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