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Paper Details

Structural and Transport Properties of PbTe Thin Films by Thermal Evaporation

U. P. Khairnar1*, S. S. Behere2, and P. H. Pawar2

Journal Title:Journal of Chemical, Biological and physical sciences
Abstract


Thin films of lead telluride (PbTe) of thicknesses from 500 to 3000 have been prepared by physical evaporation technique, onto precleaned amorphous glass substrates at constant substrate temperature. The deposited samples were annealed and annealed samples were used for characterization. Resistivity of these samples was measured by four-probe technique as a function of thickness and temperature. Activation energy for charge transport have been evaluated and found in the range of 0.14 to 0.20 eV. Thermoelectric power has been measured and found to be positive indicating that the samples are p-type semiconducting material. Mobility variation with temperature has been estimated (evaluated) and co-related with scattering mechanism in the entire range of temperature studied. The X-ray diffraction analysis confirmed that films are polycrystalline having cubic structure cell and lattice parameters are reported.

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